SKU: PRODUCT ID:CrestDeepSimUpgrade
Crest Optics DeepSIM Upgrade for DeepSIM-ready V3 Super Resolution
Crest Optics DeepSIM Upgrade for DeepSIM-ready V3 Super Resolution
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- ✓ New, with the full manufacturer warranty
- ✓ Typical delivery in 1 to 3 weeks, depending on parts
- ✓ Installation, training and service by our engineers
- ✓ SAM.gov registered (CAGE 10ZU5). Purchase orders welcome
- ✓ Leasing and finance companies available
Questions? Call (877) 564-2767 or email sales@coastalmicroscopes.com
CrestOptics DeepSIM Upgrade for DeepSIM-ready V3 (A650173)
The CrestOptics DeepSIM Upgrade (A650173) enhances your X-Light V3 spinning disk confocal system by adding Structured Illumination Microscopy (SIM) capabilities. This upgrade achieves lateral resolution of ~100 nm, allowing for super-resolution fluorescence imaging directly on your existing DeepSIM-ready V3 platform. Designed for seamless integration and rapid imaging, it is a powerful tool for detailed analysis of biological samples.
Condition
New with Manufacturer Warranty
Included Items
- CrestOptics DeepSIM Upgrade Module (A650173)
- Structured Illumination Optics
- Control and Acquisition Software
- Integration Components for X-Light V3
- User Manual and Documentation
Key Features
- Super-Resolution Imaging: Achieves ~100 nm lateral and ~300 nm axial resolution using SIM technology.
- Lattice SIM: Multi-spot structured illumination enhances spatial resolution and signal clarity.
- Fast Acquisition: Capture up to 13 frames per second at 1024x1024 resolution, ideal for live-cell imaging.
- Wide Spectral Range: Compatible with 400–750 nm excitation and 400–850 nm emission wavelengths.
- Designed for X-Light V3: Seamless upgrade path for DeepSIM-ready CrestOptics X-Light V3 systems.
- Intuitive Software: Works with μManager, VisiView®, and NIS Elements for flexible control and acquisition.
Applications
- Live-Cell Imaging
- Super-Resolution Fluorescence Microscopy
- 3D Tissue Imaging
- Neuroscience and Cell Biology
- Developmental Biology
- Pharmacological and Drug Discovery Research
Specifications
| Specification | Details |
|---|---|
| Imaging Technique | Structured Illumination Microscopy (SIM) |
| Lateral Resolution | ~100 nm |
| Axial Resolution | ~300 nm |
| Acquisition Speed | 13 fps at 1024x1024 pixels |
| Excitation Wavelength | 400–750 nm |
| Emission Wavelength | 400–850 nm |
| Field of View | 66 x 66 µm at 100X; 333 x 333 µm at 20X |
| Microscope Compatibility | DeepSIM-ready CrestOptics X-Light V3 systems |
| Software Compatibility | μManager, VisiView®, NIS Elements |
| Dimensions (W x L x H) | 356 x 435 x 290.5 mm |
| Weight | 20 kg |
| Operating Temperature | 23 ± 5°C |
| Operating Humidity | ≤70% RH (non-condensing) |
Configuration shown is for demonstration purposes. Contact us to discuss your application and needs for a customized quote.
Additional Details
Additional Details
- Manufacturer: Crest Optics
- Model:
- Catalog Number: CrestDeepSimUpgrade
- Serial Number:
- Condition: New
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