Olympus DIC Slider

Olympus U-DICR Reflected Light DIC Nomarski Prism Slider for BX / GX / MX Microscopes

The Olympus U-DICR is a reflected light differential interference contrast (DIC) Nomarski prism slider for Olympus materials and industrial microscopes. Inserted into the DIC slot of a compatible revolving nosepiece, it converts minute height differences and surface irregularities into high-contrast, relief-like images, making it ideal for inspecting metals, semiconductors, wafers, and polished surfaces. The U-DICR is Olympus's standard reflected-light DIC slider, working with UIS/UIS2 materials objectives across a wide range of magnifications, and a prism adjustment knob fine-tunes contrast and background color.

Condition

Condition: Refurbished/Used (This product has been inspected and verified to meet manufacturer specifications)

Included Items

• Olympus U-DICR Reflected Light DIC Slider

Available Separately

• Polarizer and Analyzer (e.g., U-POP3 / U-AN360-3) or U-MDIC3 Reflected DIC Mirror Unit
• Revolving Nosepiece with DIC Slider Slot
• UIS/UIS2 Materials Objectives (e.g., MPlanFL N, LMPlanFL N)

Key Features

• Reflected light Nomarski DIC for high-contrast surface relief imaging
• Reveals minute height differences, scratches, and surface defects
• Prism adjustment knob for fine control of contrast and background color
• Standard Olympus reflected DIC slider for use across a wide range of magnifications
• Fits the DIC slot of compatible Olympus nosepieces
• Genuine Olympus accessory

Applications

• Metallurgy and materials science
• Semiconductor and silicon wafer inspection
• Surface defect and topography analysis
• Industrial quality control
• Polished sample and coating inspection

Compatibility

• Olympus BX series materials/industrial microscopes (e.g., BX51M, BX61, BX53M, BXFM)
• Olympus GX series inverted metallurgical microscopes
• Olympus MX series semiconductor inspection microscopes
• UIS/UIS2 materials objectives

Specifications