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SKU: PRODUCT ID:52127h

Zeiss EC Epiplan-Neofluar DIC 50x/0.8 M27 Thread Size Microscope Objective

Zeiss EC Epiplan-Neofluar DIC 50x/0.8 M27 Thread Size Microscope Objective

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Zeiss EC Epiplan-Neofluar DIC 50X/0.80 Objective – M27 Thread (422372-9901)

The Zeiss EC Epiplan-Neofluar DIC 50X/0.80 Objective is a premium infinity-corrected objective designed for reflected-light microscopy, materials science, semiconductor inspection, and industrial imaging applications. Featuring EC Epiplan-Neofluar optics, Differential Interference Contrast (DIC) compatibility, and a numerical aperture of 0.80, this objective delivers exceptional resolution, contrast, and color correction for demanding inspection and analysis tasks. Its advanced optical design provides outstanding image quality in both brightfield and DIC observation modes.

Condition

Condition: Refurbished/Used (This product has been inspected and verified to meet manufacturer specifications)

Key Features

  • 50X magnification objective
  • Numerical Aperture (NA): 0.80
  • EC Epiplan-Neofluar optical correction
  • DIC compatible for Differential Interference Contrast microscopy
  • Designed for reflected-light and metallurgical microscopy applications
  • Plan-corrected optics for flat-field imaging
  • Enhanced contrast and color fidelity
  • Infinity-corrected optical design
  • M27 objective thread compatibility
  • Optimized for industrial inspection and digital imaging systems

Applications

  • Metallurgical microscopy
  • Semiconductor inspection
  • Materials science research
  • Failure analysis
  • Industrial quality control
  • Differential Interference Contrast (DIC) microscopy
  • Surface inspection and characterization
  • Digital imaging and documentation

Specifications

Manufacturer Zeiss
Model EC Epiplan-Neofluar DIC
Part Number 422372-9901
Magnification 50X
Numerical Aperture (NA) 0.80
Optical Correction EC Epiplan-Neofluar
DIC Compatibility Yes
Observation Method Reflected Light / Epi-Illumination
Optical System Infinity Corrected
Thread Type M27
Field Correction Plan Corrected
Application Industrial Inspection and Materials Analysis
Recommended Techniques Brightfield, DIC, Metallurgical Inspection, Digital Imaging
Compatibility Zeiss Microscope Systems Utilizing M27 Objectives and Reflected-Light Observation Methods

Additional Details

  • Manufacturer: Zeiss
  • Model:
  • Catalog Number: 52127h
  • Serial Number:
  • Condition: Used
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